The new StraDex f2-80 can measure very thin layers down to 5 µm.
ISIS sentronics
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Diversity - Market segments covered by ISISMechanical Engineering / Automotive, Wafer & MEMS, |
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New: the i-Dex stand-alone systemNew i-Dex all-in-one solution for automated measurement of precision components. With the i-Dex t model, medical precision parts such as stents can be automatically measured. More
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SemDex 301 - stand-alone systemSemdex 301 – A semi-automatic wafer inspection system for fully automated examination of manually loaded wafers measuring up to 300 mm. More
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Focus on quality - the new ISIS product rangeThe RayDex Sensor is suitable for a very broad variety of applications. Non-contact measurement of inner diameters < 1 mm becomes feasible.
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Layer thickness measurement with the new StraDex sensor:The new StraDex sensor measures both overall thicknesses and the thickness of individual layers. More
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