ISIS sentronics
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Diversity - Market segments covered by ISIS
Mechanical Engineering / Automotive, Wafer & MEMS,
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Face lift: The new designed i-Dex stand-alone system
The i-dex series received its new design - from a table solution to full inspection stand alone unit. With the ISIS stand-alone units i-dex r (for interior and exterior measurement and i-dex f (for interior measurements) it is now possible to automatically inspect precisioned parts within production environment. More
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SemDex 301 - stand-alone systemSemdex 301 – A semi-automatic wafer inspection system for fully automated examination of manually loaded wafers measuring up to 300 mm. More
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Measurement of interior spaces with RayDex
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Layer thickness measurement with the new StraDex sensor:
With new StraDex sensor overall thicknesses and the thickness of individual layers for example of adhesives, barrier layers, and coatings on woven / non woven materials can be easily measured. More
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