Skip navigation

09 / 2012 - ISIS sentronics presents: The New Generation of Fully-automated High Speed Wafer Metrology Systems

ISIS sentronics has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

12 / 2014 - ISIS sentronics at ICE Europe, 2015

10. - 12. March 2015, Munich
Hall A5, 945

ICE Europe is the leading international exhibition for everybody involved in the conversion of flexible web materials such as paper, film, foil and nonwovens. The show brings suppliers of machines and systems for the converting sector together with industry specialists in search of the latest production solutions.

12 / 2014 - ISIS sentronics at ICE USA, 2015

10. - 12. February 2015, Orlando Florida, booth 835

Join several thousand converting professionals from nearly 50 countries who will come together at ICE in Orlando, Florida to see all the latest converting machinery and technologies on display from over 350 leading suppliers.

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to ISIS sentronics

ISIS sentronics is world leader in non-contact, non-invasive optical metrology. For over six years ISIS sentronics has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by ISIS sentronics on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.