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09 / 2012 - ISIS sentronics presents: The New Generation of Fully-automated High Speed Wafer Metrology Systems

ISIS sentronics has now enhanced the form and function of the already existing fully-automated wafer inspection systems: for example the newly engineered SemDex A with advanced design.
It is not only a powerful high speed metrology device but also a wafer sorter combined in one system. Therefore, SemDex A has now successfully captured the demand of the Asian market.

07 / 2014 - ISIS sentronics at Semicon Europe 2014

07-09 October in Grenoble, Booth 765

For over three decades, the semiconductor community has consistently recognized SEMI tradeshows as the premier venues to reach the global semiconductor, microelectronics and related industries. 

07 / 2014 - ISIS sentronics at ICE Asia

17-19 September in Shanghai, Booth B17

ICE Asia is a highly specialised trade show for the converting of web materials, such as paper, film, foil and nonwovens.

Non-contact Optical Metrology Systems for Quality Assurance

Welcome to ISIS sentronics

ISIS sentronics is world leader in non-contact, non-invasive optical metrology. For over six years ISIS sentronics has been developing and marketing systems for seamless monitoring of quality processes in the areas of: wafers, automotive and coatings/ films.

Sensors developed by ISIS sentronics on the basis of optical interferometry and the company’s turnkey inspection systems for quality assurance all permit three-dimensional measurements, either of material thicknesses or of surface topographies, including roughness values.