Applications

In addition to its RayDex sensors (typically used for topography of interior spaces and measurement of shape/radii, roughness, roundness and conicity) and StraDex sensors (typically used for film and coating thickness measurements), ISIS sentronics has now introduced its new i-Dex and SemDex systems as stand-alone instruments. Permitting definition of fully automated measurement protocols for wafer materials and for the automotive/mechanical engineering sector, these new complete systems can be readily integrated into your process chain thanks to their ease of operation.