New StraDex f2-80 Thin-Layer Sensor
NEW: The i-Dex stand-alone system
New
i-Dex all-in-one solution for automated measurement of precision components.
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New SemDex A31 Wafer Inspection System
SemDex A31 – A fully automatic wafer inspection system which automatically loads, measures, and sorts up to 300-mm wafers.
ISIS at Control 2010 in Stuttgart

Meet ISIS at
Control 2010 in Stuttgart, May 04–07, Booth 3310, Hall 3
ISIS wins ICE Innovation Award
ISIS Sentronics GmbH was awarded the innovation price at the ICE 2009 in Munich
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New: i-Dex t for medical technology
automated measurement of stents and medical precision parts.
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Meet ISIS at the MedTech in Stuttgart
Meet ISIS at the MedTech in Stuttgart. From March 23rd to March 25th 2010 Hall 8, booth 2622 