New StraDex f2-80 Thin-Layer Sensor
NEW: The i-Dex stand-alone system
New
i-Dex all-in-one solution for automated measurement of precision components.
More
New SemDex A31 Wafer Inspection System
SemDex A31 – A fully automatic wafer inspection system which automatically loads, measures, and sorts up to 300-mm wafers.
ISIS at Control 2010 in Stuttgart

Meet ISIS at
Control 2010 in Stuttgart, May 04–07, Booth 3310, Hall 3
ISIS wins ICE Innovation Award
ISIS Sentronics GmbH was awarded the innovation price at the ICE 2009 in Munich
Read more.
New: i-Dex t for medical technology
automated measurement of stents and medical precision parts.
Read more
ISIS at K-Show 2010 in Düsseldorf, Germany
ISIS would like to see you at the K-Show from 27.Oct.-03.Nov. 2010 in Düsseldorf, hall 11, D66.
