Layer Thicknesses/TTV

Measurement of total thickness in a blown film extrusion plant. The data show the thickness distribution along the angular positions and the corresponding control parameters for the individual air nozzles installed in the machine (not an ISIS product). Measurement was performed with the StraDex f-2 sensor head.

Three-layer measurement during production. The layer thickness profile is recorded by the StraDex f-2 sensor head at a very high acquisition rate during film production at a speed of 140 m/min.

StraDex systems permit measurement of layer thicknesses in the wafer/semiconductor sector.

 

2D layer thickness distribution of a 200-mm silicon wafer. The pseudo colors show local deviations from the average substrate layer thickness of 291 µm. Recorded with the SemDex 301 stand-alone system.