SemDex 100 Series
SemDex 101
The SemDex 101 system is designed for off-line applications in quality assurance. It incorporates the StraDex f2 or f24 sensor head, and a motorized x-y positioning stage for measurement of layer thickness profiles.
Flat films or wafer materials up to a maximum size of 100 × 100 mm can be measured. A prism or clamping unit also permits measurement of coatings on cylindrical objects, for example from the field of medical technology.
The StraDex p sensor head can also be used for evaluation of surface profiles.
| Attachment | Size |
|---|---|
| SemDex101_eng.pdf | 1.59 MB |