StraDex a
StraDex a for roughness measurements in the sub-nm range
StraDex a
Optical Sensor as Non-contact Alternative for Roughness Measurements
Metrology:
- 3D Micro-Topographies
- 1D Roughnesses in sub-nm range
- 2D Roughnesses (load factor)
Features:
- Roughness measurement in the sub-nm range
- Acquisition times: up to 4 s; 1 s (reduced size)
- Working distance 3.5 mm
- Max. autofocus range: 150 µm
- Area measured: 400 × 400 µm²
- User-friendly TopoSpect or TopoLine software
- Optional: Integratable into external automation system or CMM
Industries / Applications: