StraDex f
Layers and coatings of a few µm up to 0.8 mm
StraDex f
Layers and coatings of a few µm up to 0.8 mm
StraDex f
Very compact construction
StraDex f
Optical Sensors as Non-contact Alternatives for Measuring Layers/Coatings and Profiles
Metrology:
- Coating thickness > 5 µm
- Bowing (Bow/Warp), flatness
- Object thickness of polymer/ glass possible
Features:
- Layers and coatings of a few µm up to 0.8 mm
- StraDex f2 – 80: Minimum layer thickness 5 µm (polymer) or 2.5 µm (silicon)
- StraDex f24 – 300: Maximum layer thickness* of 0.8 mm (polymer) or 0.35 mm (silicon)
- Repeatabilities: 10/ 100 nm (depending upon model)
- Max. acquisition rate: 4000 measuring points per second
- Very compact construction
- User-friendly software: TopoSpekt, TopoLine
- Optional: Integratable into external traversing devices or automation units
* Thicker layers can be measured but significantly reduce the data acquisition rate
Industries / Applications: