StratoSpect

Submitted by Bea on Wed, 11/04/2009 - 15:44
StratoSpect is used for measuring the thickness of films, including intermediate layers. The results of a measurement can subsequently be visualized as statistical, FFT, 2D, and 3D representations; furthermore, it is also possible to apply various mathematical filters. The measuring tasks can easily be parameterized with the aid of a wizard.

Principal features of “StratoSpect” software:
 

  •       Measurement of layer thickness including the intermediate layers of films
  •      Simple parameterization of measurement protocols by means of a wizard
  •       Statistical, FFT, 2D and 3D visualization of the measured results
  •       Use of various mathematical filters (mean, median, downsampling, etc.)
  •       Measurement of individual points, lines, grids, or freely defined points